This letter proposes an advanced convolutional neural network (CNN)-based classifier for detecting the contamination level of in-service insulator strings. The goal is to enhance condition monitoring ...

Pattern analysis of wafer maps in semiconductor manufacturing is critical for failure analysis aspects or activities that increase yield. As deep learning becomes more popular than ever, research on ...

Using PLA to evaluate some pitchers that have gotten off to slow starts, and what we can learn about them moving forward.

Here's what you should know about the new Instagram map, reposts and Friends tab features.